JPH0450538Y2 - - Google Patents
Info
- Publication number
- JPH0450538Y2 JPH0450538Y2 JP16344285U JP16344285U JPH0450538Y2 JP H0450538 Y2 JPH0450538 Y2 JP H0450538Y2 JP 16344285 U JP16344285 U JP 16344285U JP 16344285 U JP16344285 U JP 16344285U JP H0450538 Y2 JPH0450538 Y2 JP H0450538Y2
- Authority
- JP
- Japan
- Prior art keywords
- terminal
- terminals
- holder
- measurement
- measurement terminal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000005259 measurement Methods 0.000 claims description 25
- 239000011810 insulating material Substances 0.000 claims description 7
- 239000011295 pitch Substances 0.000 description 12
- 230000000694 effects Effects 0.000 description 2
- 239000002390 adhesive tape Substances 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
Landscapes
- Measuring Leads Or Probes (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16344285U JPH0450538Y2 (en]) | 1985-10-23 | 1985-10-23 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16344285U JPH0450538Y2 (en]) | 1985-10-23 | 1985-10-23 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6271570U JPS6271570U (en]) | 1987-05-07 |
JPH0450538Y2 true JPH0450538Y2 (en]) | 1992-11-27 |
Family
ID=31091644
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP16344285U Expired JPH0450538Y2 (en]) | 1985-10-23 | 1985-10-23 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0450538Y2 (en]) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI363407B (en) * | 2003-04-14 | 2012-05-01 | Sumitomo Electric Industries | Probe |
JP4954492B2 (ja) * | 2005-04-18 | 2012-06-13 | 東京エレクトロン株式会社 | プローブおよびその製造方法 |
KR101887973B1 (ko) * | 2017-04-07 | 2018-08-13 | 이근주 | 프로브핀의 분리가 용이한 엘이디 검사용 홀더블럭 |
JP2024064692A (ja) * | 2022-10-28 | 2024-05-14 | 株式会社日本マイクロニクス | コンタクトピンおよび電気的接続装置 |
-
1985
- 1985-10-23 JP JP16344285U patent/JPH0450538Y2/ja not_active Expired
Also Published As
Publication number | Publication date |
---|---|
JPS6271570U (en]) | 1987-05-07 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US5888075A (en) | Auxiliary apparatus for testing device | |
JPH0450538Y2 (en]) | ||
US5160268A (en) | Floating stackable connector | |
JPS6313666Y2 (en]) | ||
JPH085662A (ja) | 検査用プローブ | |
JPH10148651A (ja) | 電気的測定器の測定用端子 | |
US3624586A (en) | Integrated circuit connector system | |
JPH09304438A (ja) | プローブユニットおよび検査用ヘッド | |
JPH04215070A (ja) | チップ型電子部品の測定端子 | |
JPS63172969A (ja) | チツプ抵抗器の抵抗値測定方法 | |
JPH0326989U (en]) | ||
JPS62104173U (en]) | ||
JPS58138058A (ja) | 半導体装置 | |
JPS62238472A (ja) | 多端子電子部品の測定装置 | |
JPS6033284B2 (ja) | 電気部品の製造方法 | |
JPS6331009Y2 (en]) | ||
JPS6331491Y2 (en]) | ||
JP2603981Y2 (ja) | 導電接触ピン | |
JPH088460Y2 (ja) | チップ状電気部品の測定用固定ジグ | |
SU1541516A1 (ru) | Корпус электрического прибора | |
JPH11132988A (ja) | き裂測定用ゲージの探触子 | |
JPS5918681Y2 (ja) | 半導体チツプ収容器 | |
JPH0216523Y2 (en]) | ||
JPS5812443Y2 (ja) | ビ−ムリ−ドチツプノキヤリア | |
JPS60159389U (ja) | 半導体放射線位置検出器 |